Market Background:

With the explosive growth of the third generation semiconductor (SiC, GaN) in the fields of new energy, photovoltaic energy storage and new energy vehicles, and the evolution of integrated circuits to high precision and high integration, IV, CV and pulse characteristic test put forward strict requirements. As core test equipment, semiconductor parameter analyzers and source measure units (SMUs) have accuracy and stability that directly determine the success or failure of device R&D and production-line yield. However, facing the complex test scenarios of pA-level weak current and kV-level high voltage, how to accurately and efficiently calibrate according to JJF 2009-2022 specification has become the core challenge faced by measurement and testing engineers.

Hot topics:

With the official implementation of the new edition of JJF 2009-2022 Calibration Specification for Semiconductor Parameter Precision Analyzers, how to translate the stated metrological standards into practical, implementable procedures in the laboratory has become a focal point of industry attention. Currently, semiconductor device testing is facing the trend of challenging the limit parameters: On the one hand, the pA level weak leakage current and kV level high voltage testing requirements brought by advanced process and wide band gap materials, high requirements are put forward for the shielding and protection of the test system; On the other hand, the dynamic and pulse testing of devices becomes the key to evaluate the performance of real working conditions. How to use a high-bandwidth digitizer and a precision shunt to accurately capture nanosecond-level pulse signals while avoiding device self-heating effects is a critical technical challenge that metrology calibration engineers urgently need to overcome.

Solution:

For the pain points in the above industries, Fluke provides a one-stop semiconductor parameter analyzer and source meter calibration scheme: using high-precision multi-function calibrator and high-value resistor box, with protective end shielding technology, accurately crack the problems of pA-level micro-current generation and leakage prevention; Effectively avoid the load effect of kV-level high-voltage measurement through the "plus flow pressure measurement" method and eight and a half bits high-precision numeration table; precision shunt combined with high-speed digital sampling technology is adopted to directly and accurately capture nanosecond pulse shape and dynamic parameters. From low currents to high-voltage pulses, Fluke ensures comprehensive test accuracy and efficiency.

MEETING TIME:

On November 24, 2026, 14:00-15:00, the electrical product manager of fluke measurement and calibration department will focus on interpreting the calibration specifications of semiconductor parameter analyzer and source meter to the participants, and discuss the cutting-edge calibration solutions. Live broadcast will share practical cases for pA-level micro-current, kV-level high voltage and PMU pulse measurement. During this time, you can ask the speaker technical questions in the Q&A session.